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Management of an Atom Probe in a Multi-User Facility
The MRL Central Research Facilities at the University of Illinois has trained thousands of experts in fabrication and analysis of new and novel materials and devices over the last 30 years. The mixture of analytical techniques provides a researcher correlated results between different size scales and different types of analysis. The addition of the LEAP 5000 XS in 2019 extended this analysis into atom-by-atom compositional information. This seminar will discuss challenges and solutions that have been implemented for using an atom probe in a shared user facility.

Jul 26, 2022 10:00 AM in Central Time (US and Canada)

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Timothy P. Spila, Ph.D.
Senior Research Scientist @MRL Central Research Facilities at the University of Illinois
Timothy Spila received his B.S. in Engineering Science from the Pennsylvania State University in 1992 and his Ph.D. in Materials Science and Engineering under the advisement of Professor Joseph E. Greene from the University of Illinois in 2001. He has been a Research Scientist in the Materials Research Laboratory (MRL) at the University of Illinois since 2003 and is responsible for Secondary Ion Mass Spectrometry, Rutherford Backscattering Spectrometry, and Local-Electrode Atom Probe Tomography systems. In addition to instrument maintenance and the training of hundreds of new researchers on these techniques over the last 20 years, Tim has presented annual lectures on those techniques at the Advanced Materials Characterization Workshop. He has twice served as interim director of the MRL shared user facilities, which consists of over 100 instruments and is used by nearly 1000 researchers for about 100,000 hours annually.